TR8100LV为德律科技最高阶之电测设备，专为大型且复杂的电路板且低电压测试所设计。TR8100LV的真空系统可确保全部针点良好接触性，非多工式驱动/接收式数位结构,可达3,584点，针对多针点之元件测试更快更简易且制作程序更快。TRI ToggleScan™测试技术结合边界扫描提供少量或无测试点之解决方案。
• 1:1 驱动/接收数字结构
• 高测试覆盖率
• 低电压元件测试能力与超高检测速度
• 人性化界面包含快速与简单的程序设定
Tester Specifications
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Analog/hybrid test points
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TR8100LV: 3584
TR8100LLV: 5632
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Operating System
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Microsoft® Windows compatible PC with USB, Windows 7-10
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Fixture Type
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Offline press or vacuum type fixture
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Standard Testing Components
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Analog Test Hardware
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6-wire measurement switching matrix
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Programmable AC/DC/DC High voltage and current sources
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AC/DC voltage, DC current measurement, frequency
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Component R/L/C measurement
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Synthesized Arbitrary Waveform Generator
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TestJet vectorless open circuit detection
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Digital Testing
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Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
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DUT power supplies: 5 V@5 A, 3.3 V@5 A, 12 V@5A, 0.2~20 V@3 A and -3~-20 V@3 A
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On-board Flash, EEPROM, MAC programming
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Optional Components
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Analog Hardware
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Fixture Conversion Kits for Teradyne, GenRad
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Digital Testing
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Programmable DUT power supplies: 75 V / 8 A, 200W maximum output power
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Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
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Yield Management System
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YMS 4.0
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Dimensions
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WxDxH
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TR8100LV: 1150 x 850 x 830 mm
TR8100LLV: 1550 x 850 x 830 mm
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Weight
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TR8100LV: 390 kg
TR8100LLV: 450 kg
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地址： 深圳市宝安区松岗街道东方社区大田洋南一路1号2栋301
邮箱：szdrtest@szdrtest.com
电话：0755-27054139
